Microstructural Parameters of Bivoltine Silk Films using X-Ray Diffraction Studies.
Mahadevaiah, G. Thejas Urs, K. Byrappa, R. Somashekar
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Volume 2 | Pages:
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Mahadevaiah, G. Thejas Urs, K. Byrappa, R. Somashekar. Microstructural Parameters of Bivoltine Silk Films using X-Ray Diffraction Studies.. Indian J. Adv. Chem. Sci. -0001; Volume 2:.